发明名称 Voids in STI regions for forming bulk FinFETs
摘要 An integrated circuit structure includes a substrate; two insulation regions over the substrate, with one of the two insulation regions including a void therein; and a first semiconductor strip between and adjoining the two insulation regions. The first semiconductor strip includes a top portion forming a fin over top surfaces of the two insulation regions.
申请公布号 US8723271(B2) 申请公布日期 2014.05.13
申请号 US201313918728 申请日期 2013.06.14
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 YUAN FENG;LEE TSUNG-LIN;CHEN HUNG-MING;CHANG CHANG-YUN
分类号 H01L27/02 主分类号 H01L27/02
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