发明名称 Semiconductor device and a method for manufacturing a semiconductor device
摘要 A first wiring is disposed over a semiconductor substrate. A first via is disposed over the first wiring. Further, the bottom surface of the first via is in contact with the first wiring. A first insulation layer is disposed over the semiconductor substrate, and is in contact with at least the top surface of the first wiring and the side surface of the first via. At least a part of each side surface of the first wiring and the first via cuts off each metal crystal grain.
申请公布号 US8722532(B2) 申请公布日期 2014.05.13
申请号 US201213567546 申请日期 2012.08.06
申请人 USAMI TATSUYA;KITAJIMA HIROSHI;RENESAS ELECTRONICS CORPORATION 发明人 USAMI TATSUYA;KITAJIMA HIROSHI
分类号 H01L21/4763 主分类号 H01L21/4763
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