发明名称 Multi-tiered semiconductor devices and associated methods
摘要 Methods of fabricating multi-tiered semiconductor devices are described, along with apparatus and systems that include them. In one such method, a first dielectric is formed, and a second dielectric is formed in contact with the first dielectric. A channel is formed through the first dielectric and the second dielectric with a first etch chemistry, a void is formed in the first dielectric with a second etch chemistry, and a device is formed at least partially in the void in the first dielectric. Additional embodiments are also described.
申请公布号 US8722525(B2) 申请公布日期 2014.05.13
申请号 US201113165546 申请日期 2011.06.21
申请人 SINHA NISHANT;MICRON TECHNOLOGY, INC. 发明人 SINHA NISHANT
分类号 H01L21/84;H01L21/311;H01L27/06 主分类号 H01L21/84
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