| 摘要 |
PROBLEM TO BE SOLVED: To prevent reduction in accuracy of inspecting a film being conveyed.SOLUTION: In a film inspection apparatus 100, an electrolyte film Mf being conveyed is irradiated with light emitted by a planar light-emitting light source 304, and a line sensor 212 moves for scanning obliquely along a film width direction, below the electrolyte film Mf. The light emitted by the planar light-emitting light source passes through a light transmission pattern Lp formed by a liquid crystal panel 306, passes through the electrolyte film Mf, and is sensed by the line sensor 212. The light transmission pattern Lp of the liquid crystal panel 306 in irradiating the electrolyte film Mf for nature inspection is scanned in synchronization with scanning of the line sensor 212, in the film width direction along a scanning trajectory of the sensor. Position of equipment, such as the planar light-emitting light source 304, relating to light irradiation, is not moved. |
