发明名称 ETCHANT, ETCHING METHOD USING THE SAME AND MANUFACTURING METHOD OF SEMICONDUCTOR ELEMENT
摘要 PROBLEM TO BE SOLVED: To provide an etchant selectively and effectively removing a first layer containing TiN from a second layer containing specific metals, an etching method using the same and a manufacturing method of a semiconductor element.SOLUTION: An etchant removes a first layer selectively by treating a base plate having the first layer containing TiN and a second layer containing at least one metal selected from transition metals in group 3 to group 11, and contains a hexafluorosilicic acid compound and an oxidant of 0.05 mass% or more and less than 10 mass%.
申请公布号 JP2014084489(A) 申请公布日期 2014.05.12
申请号 JP20120233290 申请日期 2012.10.22
申请人 FUJIFILM CORP 发明人 KAMIMURA TETSUYA;PARK KI-YOUNG;MURO SUKETSUGU;INABA TADASHI
分类号 C23F1/16;C23F1/00;H01L21/306;H01L21/308 主分类号 C23F1/16
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