发明名称 |
ETCHANT, ETCHING METHOD USING THE SAME AND MANUFACTURING METHOD OF SEMICONDUCTOR ELEMENT |
摘要 |
PROBLEM TO BE SOLVED: To provide an etchant selectively and effectively removing a first layer containing TiN from a second layer containing specific metals, an etching method using the same and a manufacturing method of a semiconductor element.SOLUTION: An etchant removes a first layer selectively by treating a base plate having the first layer containing TiN and a second layer containing at least one metal selected from transition metals in group 3 to group 11, and contains a hexafluorosilicic acid compound and an oxidant of 0.05 mass% or more and less than 10 mass%. |
申请公布号 |
JP2014084489(A) |
申请公布日期 |
2014.05.12 |
申请号 |
JP20120233290 |
申请日期 |
2012.10.22 |
申请人 |
FUJIFILM CORP |
发明人 |
KAMIMURA TETSUYA;PARK KI-YOUNG;MURO SUKETSUGU;INABA TADASHI |
分类号 |
C23F1/16;C23F1/00;H01L21/306;H01L21/308 |
主分类号 |
C23F1/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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