发明名称 CALCULATION METHOD OF CROSSTALK CORRECTION COEFFICIENT AND FILM THICKNESS MEASUREMENT DEVICE OF TRANSPARENT FILM HAVING CALCULATION FUNCTION OF CROSSTALK CORRECTION COEFFICIENT
摘要 PROBLEM TO BE SOLVED: To provide a method by which a crosstalk correction coefficient for correcting a crosstalk generated in a measurement system where lighting means emitting a plurality of pieces of monochromatic light of different wavelengths and imaging means for the plurality of pieces of monochromatic light are used, can be obtained with simple device configuration, and to provide a film thickness measurement device of a transparent film having a function of calculating the crosstalk correction coefficient using the method.SOLUTION: A calculation method of a crosstalk correction coefficient of an optical system includes as constituents: the lighting means emitting a plurality of pieces of monochromatic light composed of M pieces of light and having known wavelengths; and the imaging means having spectral sensitivity corresponding to respective wavelengths of the M pieces of monochromatic light. The crosstalk correction coefficient is calculated from interference luminance measurement values of M+1 or more transparent films whose optical film thickness are known and different.
申请公布号 JP2014085112(A) 申请公布日期 2014.05.12
申请号 JP20120231315 申请日期 2012.10.19
申请人 TORAY ENG CO LTD 发明人 KITAGAWA KATSUICHI
分类号 G01B11/06 主分类号 G01B11/06
代理机构 代理人
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