发明名称 ELECTRONIC COMPONENT HANDLING DEVICE, ELECTRONIC COMPONENT TESTING DEVICE, AND METHOD FOR TESTING ELECTRONIC COMPONENT
摘要 <p>PROBLEM TO BE SOLVED: To provide an electronic component handling device capable of achieving miniaturization and improving throughput when the number of contact arms increases.SOLUTION: A handler 100 is provided with a plurality of contact arms 300, each of which has a holding section 380 for holding a DUT 10 and is arranged along a first direction. Each of the contact arms 300 has an adjustment unit 330 that causes the holding section 380 to relatively move with respect to a base 310 of the contact arms 300. The handler 100 includes: an imaging unit 220 that can image the DUT 10 and the holding section 380; an operation unit 230 that operates the adjustment unit 330; and a moving unit 210 that causes the imaging unit 220 and operation unit 230 to move along the X direction. The adjustment unit 330 adjusts the relative position of the holding section 380 according to the operation of the operation unit 230.</p>
申请公布号 JP2014085230(A) 申请公布日期 2014.05.12
申请号 JP20120234440 申请日期 2012.10.24
申请人 ADVANTEST CORP 发明人 KIKUCHI ARITOMO
分类号 G01R31/26 主分类号 G01R31/26
代理机构 代理人
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