发明名称 |
INSPECTION APPARATUS FOR GLASS SUBSTRATE |
摘要 |
<p>A glass substrate inspection apparatus is provided. A glass substrate inspection apparatus according to an embodiment of the present invention comprises: a light sensor which detects incident light; at least one supporting arm which supports a glass substrate; and a control unit which determines if the glass substrate and the light sensor are overlapped or a condition of the glass substrate.</p> |
申请公布号 |
KR20140055115(A) |
申请公布日期 |
2014.05.09 |
申请号 |
KR20120121476 |
申请日期 |
2012.10.30 |
申请人 |
SAMSUNG DISPLAY CO., LTD. |
发明人 |
LEE, JAE HO |
分类号 |
G01N21/88 |
主分类号 |
G01N21/88 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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