发明名称 INSPECTION APPARATUS FOR GLASS SUBSTRATE
摘要 <p>A glass substrate inspection apparatus is provided. A glass substrate inspection apparatus according to an embodiment of the present invention comprises: a light sensor which detects incident light; at least one supporting arm which supports a glass substrate; and a control unit which determines if the glass substrate and the light sensor are overlapped or a condition of the glass substrate.</p>
申请公布号 KR20140055115(A) 申请公布日期 2014.05.09
申请号 KR20120121476 申请日期 2012.10.30
申请人 SAMSUNG DISPLAY CO., LTD. 发明人 LEE, JAE HO
分类号 G01N21/88 主分类号 G01N21/88
代理机构 代理人
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