SYSTEM AND METHOD FOR ANALYZING OF DEFECT POSITION
摘要
<p>The present invention relates to a defect position analysis system and a method thereof comprising: a step of storing design data and product information; a step of collecting a panel-based defect coordinate delivered from a plurality of multiple inspection device in each inspection process of a panel to manufacture a printed circuit board; and a step of converting the panel-based defect coordinate into a defect coordinate for each object using the design data and a standard coordinate conversion.</p>
