| 摘要 |
In an embodiment, a method comprises: creating and storing laboratory test turnaround time (TAT) measurement data comprising one or more TAT values for one or more time segments associated with one or more laboratory sample processing stages in a testing laboratory; wherein, for a particular laboratory sample processing stage, a particular TAT value, from the one or more TAT values, is associated with a particular time segment, from the one or more time segments; applying one or more segment specific rules to the particular TAT value associated with the particular time segment to determine whether the particular TAT value is invalid; in response to determining that the particular TAT value is invalid, modifying the TAT measurement data for the particular time segment for the particular stage by removing the particular TAT value; repeating the applying and the modifying for all the TAT measurement data. |
