INTERFEROMETERY ON A PLANAR SUBSTRATE

摘要

An interferometer comprising a planar substrate is provided. The interferometer has a splitter formed on the planar substrate to split a received optical signal, a sample arm formed on the planar substrate to receive a first portion of the split optical signal and direct the first portion toward a sample, a reference arm formed on the planar substrate to receive a second portion of the split optical signal, and a detector element to receive an interferogram generated by interfering the second portion of the split optical signal with a received sample signal generated by the first portion of the split signal interacting with the sample.