| 摘要 |
The present invention relates to a conductive contactor for testing a semiconductor, which is disposed between a semiconductor with multiple terminal formed at an interval of a first pitch and a test circuit board with a plurality of second terminals formed at an interval of a second pitch greater than the first pitch and which electrically connects the first terminal and the second terminal. The conductive contactor for testing a semiconductor comprises a first insulating body; a plurality of first conductive pattern parts which is vertically disposed inside the first insulating body at an interval corresponding to the first pitch and the upper part of which is electrically in contact with the first terminal; a second insulating body disposed below the first insulating body; a plurality of second conductive pad parts which is disposed vertically inside the second insulating body at an interval corresponding to the second pitch and the lower part of which is electrically in contact with the second terminal; and a printed circuit board which has a plurality of first conductive pads and a plurality of second conductive pads. |
