| 摘要 |
PROBLEM TO BE SOLVED: To provide an identifier generation method of a semiconductor integrated circuit which can impart an identifier which has higher reliability than in the past.SOLUTION: An identifier generation method according to the present embodiment is an identifier generation method of generating an identifier for identifying a plurality of semiconductor integrated circuits having the same configurations from each other, comprises generating an identifier to be imparted to each of the plurality of semiconductor integrated circuits based on power supply current value to a plurality of preset internal states in a non-operational state of the semiconductor integrated circuit. |
