| 摘要 |
<p>The purpose of the present invention is to improve efficiency in margin testing of memory. A storage unit stores a specified margin indicating a length of a timing margin for signal processing to operate normally in association with each combination of type of memory and information on an environment for an information processing device. A processing unit performs signal processing while varying points in time of edges of a strobe signal, which are timings of operation for the signal processing. An acquisition unit acquires a measured margin, which is a range in which the signal processing performed at the processing unit has operated normally. An assessment unit extracts the memory installed in the information processing device and the specified margin corresponding to the current environment of the information processing device from the storage unit. Then, the assessment unit compares the extracted specified margin with the acquired measured margin, and if the measured margin is shorter than the specified margin, assesses that the on-board memory installed in the information processing device does not operate normally in the information processing device.</p> |
