发明名称 EPITAXIAL WAFER AND METHOD FOR MANUFACTURING SAME
摘要 <p>Provided is a method for manufacturing an epitaxial wafer, and the method comprises: a preliminarily growing step of growing an epitaxial layer up to a designated first thickness by a designated first growth speed at a designated first growth temperature by injecting a reaction source for epitaxial growth on a semiconductor wafer arranged within a chamber; a heat treatment step of performing heat treatment for the preliminarily grown epitaxial layer for a predetermined time; and a subsequent growing step of growing the epitaxial layer up to a target thickness by a designated second growth speed at a designated second growth temperature by injecting the reaction source on the thermally treated semiconductor wafer, wherein the first growth speed is slower than the second growth speed.</p>
申请公布号 WO2014069859(A1) 申请公布日期 2014.05.08
申请号 WO2013KR09645 申请日期 2013.10.29
申请人 LG INNOTEK CO., LTD. 发明人 KANG, SEOK MIN
分类号 H01L21/20 主分类号 H01L21/20
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