| 摘要 |
<p>The method involves comparing normalized vector for chemical composition at each measuring point of sample with normalized vector of each suspected crystal structure, for outputting quality factor for respective correspondence of vectors. The diffraction tape determined at each measuring point is compared with diffraction tape of each suspected crystal structure, for outputting quality factor for correspondence of diffraction tapes. The total quality is determined from two quality factors, so as to associate the crystal structure with highest total quality to measuring point. A list of crystal structures suspected in the sample is provided and data regarding chemical composition and electron diffraction image of the crystal structures is stored. An independent claim is included for computer readable storage medium storing computer program for identifying crystalline phases in polycrystalline sample.</p> |
