| 摘要 |
Provided is an inspection chip with improved quantitative accuracy. A first connecting portion (121) of each of multiple stages of specimen quantifying sections (114) of the inspection chip (2) has a first wall face (123) connected thereto. A second connecting portion (122) of each specimen quantifying section (114) has a second wall face (124) connected thereto. A third wall face (125) connected to a second wall face (124) is contained in channels (120) having openings (127). A first virtual line (75) drawn from the tip of a third wall face (125) in an opening (127) in a direction orthogonal to the second wall face (124) that is connected to an Nth stage specimen quantifying section (114) is located more toward the first wall face (123) side of an N+1 stage specimen quantifying section (114) than a second virtual line (76) that joins the tip of the third wall face (125) in the opening (127) with the second connecting portion (122) of the N+1 stage specimen quantifying section (114). The opening (127) is located more toward the second wall face (124) side of the N+1 stage specimen quantifying section (114) than a third virtual line (77) drawn from the second connecting portion (122) of the N+1 stage specimen quantifying section (114) in a direction orthogonal to a virtual face (128). |
