| 摘要 |
The invention is related to an apparatus and method for x-ray inspections based on x-ray scanning of an object (110) under examination utilizing x-ray detectors (106, 107) capable of counting the photons incident on each spatial element, providing not only a measurement of the attenuation produced by the object, but also recognition of the individual photon energy and association of the counts to an histogram with predefined energy bands. The invention is characterized by the elaboration of the spatial data and the histogram data by a statistical and iterative method, with dynamic arrangement of the histogram energy bands and data processing through an expert system, in order to identify homogeneous substances, either solid or liquid or gaseous, and determine their chemical composition with fast response and high level of accuracy. |
