发明名称 Nonvolatile memory device and method for manufacturing the same
摘要 According to one embodiment, a nonvolatile memory device includes a lower electrode layer, a nanomaterial assembly layer, and an upper electrode layer. The nanomaterial assembly layer is provided on the lower electrode layer and includes a plurality of micro conductive bodies assembled via a gap. The upper electrode layer is provided on the nanomaterial assembly layer. The portion of the micro conductive bodies is buried at least in a lower part of the upper electrode layer.
申请公布号 US8716691(B2) 申请公布日期 2014.05.06
申请号 US20100973183 申请日期 2010.12.20
申请人 OSHINO SHIGETO;KABUSHIKI KAISHA TOSHIBA 发明人 OSHINO SHIGETO
分类号 H01L45/00 主分类号 H01L45/00
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