发明名称 System and method for testing computer under varying environmental conditions
摘要 A system for testing a computer includes a single chip microcontroller (SCM), an environmental test chamber, and a control device connected to the SCM and the environmental test chamber. The SCM repeatedly switches the computer on and off and monitors the computer's response. The environmental test chamber accommodates the computer. The control device receives monitored data from the SCM and controls temperature and humidity in the environmental test chamber.
申请公布号 US8717049(B2) 申请公布日期 2014.05.06
申请号 US201113193623 申请日期 2011.07.29
申请人 XIE LING-YU;XIE XING-PING;HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD.;HON HAI PRECISION INDUSTRY CO., LTD. 发明人 XIE LING-YU;XIE XING-PING
分类号 G01R31/10;G01K7/00 主分类号 G01R31/10
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