发明名称 Method of fabricating metal-insulator-metal (MIM) capacitor within topmost thick inter-metal dielectric layers
摘要 Embodiments of MIM capacitors may be embedded into a thick IMD layer with enough thickness (e.g., 10 KŘ30 KÅ) to get high capacitance, which may be on top of a thinner IMD layer. MIM capacitors may be formed among three adjacent metal layers which have two thick IMD layers separating the three adjacent metal layers. Materials such as TaN or TiN are used as bottom/top electrodes & Cu barrier. The metal layer above the thick IMD layer may act as the top electrode connection. The metal layer under the thick IMD layer may act as the bottom electrode connection. The capacitor may be of different shapes such as cylindrical shape, or a concave shape. Many kinds of materials (Si3N4, ZrO2, HfO2, BST . . . etc) can be used as the dielectric material. The MIM capacitors are formed by one or two extra masks while forming other non-capacitor logic of the circuit.
申请公布号 US8716100(B2) 申请公布日期 2014.05.06
申请号 US201113212922 申请日期 2011.08.18
申请人 TZENG KUO-CHYUAN;TRAN LUAN C.;WANG CHEN-JONG;TU KUO-CHI;LEE HSIANG-FAN;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 TZENG KUO-CHYUAN;TRAN LUAN C.;WANG CHEN-JONG;TU KUO-CHI;LEE HSIANG-FAN
分类号 H01L21/20 主分类号 H01L21/20
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