发明名称 Three photomask sidewall image transfer method
摘要 A three photomask image transfer method. The method includes using a first photomask, defining a set of mandrels on a hardmask layer on a substrate; forming sidewall spacers on sidewalls of the mandrels, the sidewall spacers spaced apart; removing the set of mandrels; using a second photomask, removing regions of the sidewall spacers forming trimmed sidewall spacers and defining a pattern of first features; forming a pattern transfer layer on the trimmed sidewall spacers and the hardmask layer not covered by the trimmed sidewall spacers; using a third photomask, defining a pattern of second features in the transfer layer, at least one of the second features abutting at least one feature of the pattern of first features; and simultaneously transferring the pattern of first features and the pattern of second features into the hardmask layer thereby forming a patterned hardmask layer.
申请公布号 US8716133(B2) 申请公布日期 2014.05.06
申请号 US201213592683 申请日期 2012.08.23
申请人 CHEN SHYNG-TSONG;JUNG RYAN O.;LAFFERTY NEAL V.;YIN YUNPENG;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CHEN SHYNG-TSONG;JUNG RYAN O.;LAFFERTY NEAL V.;YIN YUNPENG
分类号 H01L21/44 主分类号 H01L21/44
代理机构 代理人
主权项
地址