发明名称 Substrate processing methods for reflectors
摘要 A substrate processing method may include forming a plasma; extracting ions from the plasma and accelerating the ions to have uniform or substantially uniform directivity using a grid system; irradiating the ions at a reflector, wherein the reflector includes a plurality of reflecting plates each having a metal plate and an insulating layer on the metal plate, wherein the reflecting plates are parallel or substantially parallel such that the insulating layers are exposed to the ions; reflecting the ions incident on the reflecting plates away from the insulating layers of the reflecting plates; colliding the ions reflected away from the insulating layers with the metal plates to convert the ions into neutral beams; and irradiating the neutral beams onto a substrate to process the substrate.
申请公布号 US8715472(B2) 申请公布日期 2014.05.06
申请号 US20100659331 申请日期 2010.03.04
申请人 HWANG SUNG-WOOK;SHIN CHUL-HO;SAMSUNG ELECTRONICS CO., LTD. 发明人 HWANG SUNG-WOOK;SHIN CHUL-HO
分类号 C23C14/34 主分类号 C23C14/34
代理机构 代理人
主权项
地址
您可能感兴趣的专利