发明名称 |
Device and method for inspecting polycrystalline silicon layer |
摘要 |
A device for inspecting a polycrystalline silicon layer that is crystallized by receiving irradiated laser beams on a front side of the polycrystalline silicon layer includes: a light source configured to emit inspection beams to a rear side of the polycrystalline silicon layer; a light inspector configured to inspect the inspection beams reflected at the rear side of the polycrystalline silicon layer; and a controller that controls the light source and the light inspector. |
申请公布号 |
US8717555(B2) |
申请公布日期 |
2014.05.06 |
申请号 |
US201113214272 |
申请日期 |
2011.08.22 |
申请人 |
VORONOV ALEXANDER;LEE SUK-HO;YOO JAE-SEUNG;HEO KYUNG-HOE;HAN GYOO-WAN;SAMSUNG DISPLAY CO., LTD. |
发明人 |
VORONOV ALEXANDER;LEE SUK-HO;YOO JAE-SEUNG;HEO KYUNG-HOE;HAN GYOO-WAN |
分类号 |
G01N21/00 |
主分类号 |
G01N21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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