| 摘要 |
<p>The method involves carrying out computation (106) to generate a mesh of a surface from an initial mesh. A statistical error analysis of a vertical total electron content is determined by a statistical estimator and the initial mesh in case of a weak disturbance (P1), or by an initial statistical estimator and the mesh in case of a strong disturbance (P2). The statistical error analysis is carried out to select a weak error (E1), which implies validation of adaptation of the method, or a strong error (E2), which implies the stopping of the method between two preset error levels.</p> |
