| 摘要 |
Provided is a handler for testing a semiconductor, capable of increasing the reliability of the semiconductor withdrawing process and the transfer reliability of a semiconductor tester by stabilizing the posture of a c-tray at the semiconductor withdrawal standby position. The handler for testing a semiconductor, according to an embodiment of the present invention, comprises a transferring plate (1) with tray-guiding rails (10) on the front and back sides of the upper part; a semiconductor withdrawal standby position-transferring conveyer driving unit (2) for the lowest semiconductor which is installed on the c-tray transfer standby position of the transferring plate (1); a forward guide (3) which is installed right before the tray transfer standby position and guides the lowest c-tray to go down vertically when the lowest c-tray, among c-trays (20) laminated vertically, gets out of the c-tray pile; a tail guide (4) which vertically guides the back edge of the lowest c-tray; a cylinder (8) driving center support (7) which is installed right behind the semiconductor withdrawal standby position and pushes one edge of the arrived c-tray to maintain balance; an arrival detecting sensor (9) which is installed on the end of the transferring plate (1) and detects the arrived c-tray (20a); and a cylinder (5) driving stopper (6) which synchronizes with the detection signal of the arrival detecting sensor (9) and stops the c-tray, wherein clamps (11) are installed on the front and back sides of the transferring plate at the semiconductor withdrawal standby position to press the front and back edges of the arrived c-tray. |
