| 摘要 |
A method of manufacturing a semiconductor device includes sequentially forming an n−type epitaxial layer, a p type epitaxial layer, and a first n+ region on a first surface of an n+ type silicon carbide substrate, and forming a trench through the first n+ region and the p type epitaxial layer, wherein the forming of the trench includes forming a photosensitive layer pattern on the first n+ region, etching the first n+ region and the p type epitaxial layer by using the photosensitive layer pattern as a mask, forming a buffer layer by using amorphous carbon on the first n+ region after the photosensitive layer pattern is removed, forming a buffer layer pattern by etching the buffer layer, etching using the buffer layer pattern as the mask, isotropically etching to form a second portion of the trench, and removing the buffer layer pattern. |
