发明名称 Bump Interconnection Ratio for Robust CPI Window
摘要 The disclosure is directed to a device and method for manufacture thereof. The device includes a first workpiece bonded to a second workpiece by a bump interconnection structure. The bump interconnection structure allows for optimized packaging assembly yield and bond integrity.
申请公布号 US2014117532(A1) 申请公布日期 2014.05.01
申请号 US201213660441 申请日期 2012.10.25
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 CHUANG CHITA;CHUANG YAO-CHUN;HSU YU-CHEN;TSENG MING HUNG;CHEN CHEN-SHIEN
分类号 H01L23/485;H01L21/60 主分类号 H01L23/485
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