发明名称 Automatic testing apparatus for embedded software, automatic testing method thereof and test scenario composing method
摘要 <p>An automatic test apparatus for embedded software, an automatic testing method thereof and a test scenario composing method may be used to detect an unpredictable problem as well as a predictable problem that may occur under user's conditions and reproduce various events. The automatic testing apparatus may include a keyword composer which extracts a keyword from status information output by executing the embedded software, and composes a keyword list using the extracted keywords, an output analyzer which analyzes the output from the execution of the embedded software based on the composed keyword list, a control command generator which loads at least one scenario previously stored in accordance with the analysis results, and generates an instruction list corresponding to a predetermined event status, and a test processor which processes the embedded software to reproduce the event status based on the generated instruction list.</p>
申请公布号 EP2725494(A1) 申请公布日期 2014.04.30
申请号 EP20130188768 申请日期 2013.10.15
申请人 SAMSUNG ELECTRONICS CO., LTD 发明人 LEE, BYEONG-HU
分类号 G06F11/36 主分类号 G06F11/36
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