| 摘要 |
<p>A measuring device for immunochromatography test piece comprising an irradiation optical system for irradiating measurement light onto an immunochromatography test piece, and a detection optical system for detecting reflected light from the immunochromatography test piece under irradiation with the measurement light. The irradiation optical system comprises a semiconductor light emitting element, a beam shaping member, a lens, a first baffle portion, a second baffle portion, and a third baffle portion. The beam shaping member shapes light from the semiconductor light emitting element, into a beam of a beam section extending in a direction substantially parallel to a colored line formed on the immunochromatography test piece. The lens focuses the beam from the beam shaping member on the immunochromatography test piece. The first baffle portion removes stray light, which is disposed between the semiconductor light emitting element and the beam shaping member. The second baffle portion removes stray light, which is disposed between the beam shaping member and the lens. The third baffle portion removes stray light, which is disposed between the lens and the immunochromatography test piece.</p> |
