<p>A self-trim circuit provides a technique to trim a CUT (circuit under trim) using a LSB offset to determine the best digital value to trim the CUT. The self-trim circuit is also used to self-test the digital and analog portions of the self-trim circuitry, whereby the existence of a digital stuck at fault condition is detected. A state machine controls a digital stack to couple digital trim data to the CUT and read the output of a comparator circuit that signifies when a proper digital trim value has been used. Thereafter the proper digital trim value is stored into a nonvolatile memory.</p>
申请公布号
EP2253966(B1)
申请公布日期
2014.04.30
申请号
EP20090392001
申请日期
2009.05.18
申请人
DIALOG SEMICONDUCTOR GMBH
发明人
MARTIN VON STAUDT, HANS;NUELSS, ROLF;KELLER, MICHAEL;BURKHARDT, HELMUT