发明名称 SYSTEMS AND METHODS FOR REDUCING THE INFLUENCE OF PLASMA-GENERATED DEBRIS ON THE INTERNAL COMPONENTS OF AN EUV LIGHT SOURCE
摘要 <p>Systems and methods are disclosed for reducing the influence of plasma generated debris on internal components of an EUV light source. In one aspect, an EUV meteorology monitor is provided which may have a heater to heat an internal multi-layer filtering mirror to a temperature sufficient to remove deposited debris from the mirror. In another aspect, a device is disclosed for removing plasma generated debris from an EUV light source collector mirror having a different debris deposition rate at different zones on the collector mirror. In a particular aspect, an EUV collector mirror system may comprise a source of hydrogen to combine with Li debris to create LiH on a collector surface; and a sputtering system to sputter LiH from the collector surface. In another aspect, an apparatus for etching debris from a surface of a EUV light source collector mirror with a controlled plasma etch rate is disclosed.</p>
申请公布号 EP1779410(B1) 申请公布日期 2014.04.30
申请号 EP20050775431 申请日期 2005.07.15
申请人 CYMER, INC. 发明人 ERSHOV, ALEXANDER, I.;MARX, WILLIAM, F.;BOWERING, NORBERT R.;HANSSON, BJORN, A., M.;KHODYKIN, OLEH;FOMENKOV, IGOR, V.;PARTLO, WILLIAM, N.
分类号 C25F1/00;G03F7/20;G21K1/06;H05G2/00 主分类号 C25F1/00
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