| 摘要 |
A measuring device for measuring magnetic properties of the surroundings of the device includes at least one magnetoresistive element extending in a line direction, and a support field device generating a magnetic support field in an area over the line direction. A pre-magnetization device of one or more magnets are arranged at a distance from the sensor line in a direction vertical to the line direction and extending parallel to the line direction. The pre-magnetization device is arranged relative to the sensor line such that the fields of the pre-magnetization device and the support magnetic field overlap to provide an overlapping magnetic field with a field strength component pointing in the line direction that is greater at one location on the sensor line than the strength of a field component pointing vertically toward the line direction not in the direction of the height of the magnetoresistive element. |
