发明名称 Automatic testing apparatus for embedded software and automatic testing method thereof
摘要 <p>An automatic test apparatus for embedded software and an automatic testing method thereof, the automatic testing apparatus for embedded software, includes an output detector which collects interface status information in accordance with data transmission/reception from at least one of first and second electronic devices respectively loaded with first and second embedded software and exchanging data therebetween, and extracts a keyword from the collected interface status information, a scenario composer which uses identification information about the first and second embedded software and the extracted keyword, and composes a scenario corresponding to a predetermined event status and a control command generator which generates a control command to reproduce the event status based on the composed scenario. Thus, it is possible to previously detect unpredictable and predictable problems that may occur in interaction between the plurality of embedded software, interface operation to transmit and receive data, etc., and reproduce them.</p>
申请公布号 EP2725493(A1) 申请公布日期 2014.04.30
申请号 EP20130188577 申请日期 2013.10.14
申请人 SAMSUNG ELECTRONICS CO., LTD 发明人 LEE, BYEONG-HU;KANG, TAI-RYONG;KIM, SANG-DEOK;PARK, YONG-HEE;LEE, SANG-RAE;LEE, JAE-HOON
分类号 G06F11/36 主分类号 G06F11/36
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