发明名称 Single-electron detection method and apparatus for solid-state intensity image sensors with a charge splitting device
摘要 Embodiments of the present invention include an electron counter with a charge-coupled device (CCD) register configured to transfer electrons to a Geiger-mode avalanche diode (GM-AD) array operably coupled to the output of the CCD register. At high charge levels, a nondestructive amplifier senses the charge at the CCD register output to provide an analog indication of the charge. At low charge levels, noiseless charge splitters or meters divide the charge into single-electron packets, each of which is detected by a GM-AD that provides a digital output indicating whether an electron is present. Example electron counters are particularly well suited for counting photoelectrons generated by large-format, high-speed imaging arrays because they operate with high dynamic range and high sensitivity. As a result, they can be used to image scenes over a wide range of light levels.
申请公布号 US8710424(B2) 申请公布日期 2014.04.29
申请号 US201213692306 申请日期 2012.12.03
申请人 MASSACHUSETTS INSTITUTE OF TECHNOLOGY 发明人 SHAVER DAVID C.;KOSICKI BERNARD B.;REICH ROBERT K.;RATHMAN DENNIS D.;SCHUETTE DANIEL R.;AULL BRIAN F.
分类号 G01J1/44;H01J40/14;H03F3/08 主分类号 G01J1/44
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