发明名称 Ion beam system and method of operating ion beam system
摘要 An ion beam system comprises a voltage supply system 7 and at least one beam deflector 39 having a plurality of first defection electrodes 51a, 51b, 51c and a plurality of second deflection electrodes 52a, 52b, 52c wherein the voltage supply system is configured to supply different adjustable deflection voltages to the plurality of second deflection electrodes such that electric deflection fields between the plurality of second deflection electrodes and the plurality of opposite first deflection electrodes have a common orientation. The ion beam system has a high kinetic energy mode in which a distribution of the electric deflection fields has a greater width, and a low kinetic energy mode in which a distribution of the electric deflection fields has a smaller width.
申请公布号 US8710451(B2) 申请公布日期 2014.04.29
申请号 US201113251174 申请日期 2011.09.30
申请人 BIBERGER JOSEF;PULWEY RALPH;ADOLF ANDREAS;CARL ZEISS MICROSCOPY GMBH 发明人 BIBERGER JOSEF;PULWEY RALPH;ADOLF ANDREAS
分类号 H01J37/317 主分类号 H01J37/317
代理机构 代理人
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