发明名称 Single check memory devices and methods
摘要 Memory devices and methods of operating memory devices are shown. Configurations described include circuits to perform a single check between programming pulses to determine a threshold voltage with respect to desired benchmark voltages. In one example, the benchmark voltages are used to change a programming speed of selected memory cells.
申请公布号 US8711616(B2) 申请公布日期 2014.04.29
申请号 US20100975494 申请日期 2010.12.22
申请人 SARIN VISHAL;YIP AARON;TANAKA TOMOHARU;MICRON TECHNOLOGY, INC. 发明人 SARIN VISHAL;YIP AARON;TANAKA TOMOHARU
分类号 G11C11/34 主分类号 G11C11/34
代理机构 代理人
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