发明名称 Resistive memory element sensing using averaging
摘要 A system for determining the logic state of a resistive memory cell element, for example an MRAM resistive cell element. The system includes a controlled voltage supply, an electronic charge reservoir, a current source, and a pulse counter. The controlled voltage supply is connected to the resistive memory cell element to maintain a constant voltage across the resistive element. The charge reservoir is connected to the voltage supply to provide a current through the resistive element. The current source is connected to the charge reservoir to repeatedly supply a pulse of current to recharge the reservoir upon depletion of electronic charge from the reservoir, and the pulse counter provides a count of the number of pulses supplied by the current source over a predetermined time. The count represents a logic state of the memory cell element.
申请公布号 US8711605(B2) 申请公布日期 2014.04.29
申请号 US201313868544 申请日期 2013.04.23
申请人 MICRON TECHNOLOGY, INC. 发明人 BAKER R. JACOB
分类号 G11C11/21;G11C11/16 主分类号 G11C11/21
代理机构 代理人
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