发明名称 Victim port-based design for test area overhead reduction in multiport latch-based memories
摘要 A multiport latch-based memory device includes a latch array, a plurality of first multiplexers, and a second multiplexer. The latch array is responsive to output data from an input data register in a functional mode associated with the latch-based memory device. The plurality of first multiplexers is responsive to output data from the latch array in the functional mode. The plurality of first multiplexers is responsive to output data from the input data register in a test mode associated with the latch-based memory device. The second multiplexer selectively provides output data from the plurality of first multiplexers to the input data register in the test mode, thereby providing a data path bypassing the latch array in the test mode. Embodiments of a corresponding method and computer-readable medium are also provided.
申请公布号 US8711645(B2) 申请公布日期 2014.04.29
申请号 US201213431614 申请日期 2012.03.27
申请人 CHAKRAVARTY SREEJIT;LSI CORPORATION 发明人 CHAKRAVARTY SREEJIT
分类号 G11C29/50;G11C11/401;G11C29/02;G11C29/34 主分类号 G11C29/50
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