发明名称 |
Method for manufacturing non-volatile memory device, non-volatile memory element, and non-volatile memory device |
摘要 |
A manufacturing method for manufacturing, with a simple process, a non-volatile memory apparatus having a stable memory performance includes: (a) forming a stacking-structure body above a substrate by alternately stacking conductive layers comprising a transition metal and interlayer insulating films comprising an insulating material; (b) forming a contact hole penetrating through the stacking-structure body to expose part of each of the conductive layers; (c) forming variable resistance layers by oxidizing the part of each of the conductive layers, the part being exposed in the contact hole, and each of the variable resistance layers having a resistance value that reversibly changes according to an application of an electric signal; and (d) forming a pillar electrode in the contact hole by embedding a conductive material in the contact hole, the pillar electrode being connected to each of the variable resistance layers. |
申请公布号 |
US8710484(B2) |
申请公布日期 |
2014.04.29 |
申请号 |
US201113580401 |
申请日期 |
2011.02.23 |
申请人 |
WEI ZHIQIANG;TAKAGI TAKESHI;IIJIMA MITSUTERU;PANASONIC CORPORATION |
发明人 |
WEI ZHIQIANG;TAKAGI TAKESHI;IIJIMA MITSUTERU |
分类号 |
H01L47/00 |
主分类号 |
H01L47/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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