发明名称 METHOD FOR MODELING DELAY TIME AND OUTPUT TIME OF GATE
摘要 The present invention relates to a modeling method which estimates delay time and output time of a gate when a body bias voltage is applied. A method of modeling the delay time or the output time of the gate according to the present invention includes a step of selecting a first gate among a plurality of gates; a step of determining the structure of the selected first gate; a step of generating the delay time ratio or the output time ratio of the selected first gate according to the determination result; and a step of calculating the delay time or the output time of a second gate when the body bias voltage is applied based on the delay time or the output time of the second gate among the generated delay time ratio or the output time ratio and the gates. [Reference numerals] (110) First delay time table; (120) Delay time ratio table; (130) Second delay time table
申请公布号 KR20140050151(A) 申请公布日期 2014.04.29
申请号 KR20120115554 申请日期 2012.10.17
申请人 SAMSUNG ELECTRONICS CO., LTD.;KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 SEO, MUN JUN;BAEK, DON KYU;SHIN, YOUNG SOO;SHIN, IN SUP;KIM, HYUNG OCK;OH, CHUNG KI;JEON, JAE HAN;DO, KYUNG TAE;CHOI, JUNG YUN
分类号 H01L21/00;G06F17/50;H01L21/66 主分类号 H01L21/00
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