发明名称 TSV Formation
摘要 A device includes a substrate having a front side and a backside, the backside being opposite the front side. An isolation layer is disposed on the front side of the substrate, wherein first portions of isolation layer and the substrate are in physical contact. A through substrate via (TSV) extends from the front side to the backside of the substrate. An oxide liner is on a sidewall of the TSV. The oxide liner extends between second portions of the substrate and the isolation layer. A dielectric layer having a metal pad is disposed over the isolation layer on the front side of the substrate. The metal pad and the TSV are formed of a same material.
申请公布号 US2014110862(A1) 申请公布日期 2014.04.24
申请号 US201314144775 申请日期 2013.12.31
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 JENG SHIN-PUU;CHIOU WEN-CHIH;YANG KU-FENG
分类号 H01L21/768;H01L23/522 主分类号 H01L21/768
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