| 摘要 |
PROBLEM TO BE SOLVED: To provide a circuit board testing device capable of performing insulation tests and component tests without complicating the structure and causing test signal deterioration.SOLUTION: A circuit board testing device includes: a scanner 3 which shifts between a disconnected state in which all the probe pins 21 are disconnected from a first test unit 4 and a connected state in which some of the probe pins 21 are connected to the first test unit 4; a second test unit 5 which is directly connected through wiring to probe pins 21 in contact with conductor patterns P which constitute a conductor pattern group GP and are connected to electronic components; a power supply unit 8 which supplies a voltage V1 to the first test unit 4 and others; a floating power supply unit 9 which supplies a voltage V2 electrically insulated from the voltage V1 to the second test unit 5; and a control unit 6 which carries out an insulation test process in which the scanner 3 is controlled to let the first test unit 4 test insulation between a pair selected from conductor pattern groups GP1, GP2 and a conductor pattern P16, and a component test process in which the scanner 3 is shifted into the disconnected state to let the second test unit 5 perform component tests. |
