发明名称 IMAGE INSPECTION DEVICE, IMAGE INSPECTION SYSTEM, AND IMAGE INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To perform, in inspection of an image by comparing a master image with an image obtained by reading an output result of image formation output, setting of a threshold for determining defects on the basis of a comparison result in an easy and suitable manner.SOLUTION: An image inspection device generates a difference between a master image and a defective image for threshold determination obtained by artificially adding defects to an image displaying a normal state of an image, and determines a threshold for comparing a difference between a reading image and the master image with the difference between the defective image for threshold determination and the master image, in order to determine defects of the reading image, on the basis of the difference between the defective image for threshold determination and the master image. For a reading image of an image for range determination on which defects of which degree gradually changes at a predetermined interval are displayed, the image inspection device further performs defect determination respectively at an upper limit and a lower limit of a settable threshold, and determines a range of the degree of the plurality of artificial defects having different degrees in the defective image for threshold determination, on the basis of the degrees of the defects as determined in the defect determination at the respective upper limit and lower limit of the settable threshold.
申请公布号 JP2014074710(A) 申请公布日期 2014.04.24
申请号 JP20130165590 申请日期 2013.08.08
申请人 RICOH CO LTD 发明人 KANEKO HITOMI;KITAI TADASHI
分类号 G01N21/88;G01B11/30;G01N21/892;G06T1/00 主分类号 G01N21/88
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