发明名称 Semiconductor Device Having an Interconnect Structure with TSV Using Encapsulant for Structural Support
摘要 A semiconductor device includes a substrate and a via extending through the substrate. A first insulating layer is disposed on sidewalls of the via. An electrically conductive material is disposed in the via over the first insulating layer to form a TSV. A first interconnect structure is disposed over a first side of the substrate. A semiconductor die or a component is mounted to the first interconnect structure. An encapsulant is disposed over the first interconnect structure and semiconductor die or component. A second interconnect structure is disposed over the second side of the substrate. The second interconnect structure is electrically connected to the TSV. The second interconnect structure includes a second insulating layer disposed over the second surface of the substrate and TSV, and a first conductive layer disposed over the TSV and in contact with the TSV through the second insulating layer.
申请公布号 US2014110861(A1) 申请公布日期 2014.04.24
申请号 US201314143891 申请日期 2013.12.30
申请人 STATS CHIPPAC, LTD;STATS CHIPPAC, LTD. 发明人 SUTHIWONGSUNTHORN NATHAPONG;MARIMUTHU PANDI C.;KU JAE HUN;OMANDAM GLENN;GOH HIN HWA;HENG KOCK LIANG;CAPARAS JOSE A.
分类号 H01L21/48;H01L21/56;H01L23/498 主分类号 H01L21/48
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