发明名称 ETCHING OF BLOCK-COPOLYMERS
摘要 PROBLEM TO BE SOLVED: To provide preferable dry etching of a self-organizing block-copolymer material.SOLUTION: The method comprises the steps of: forming on a substrate 23 a self-organizing block-copolymer layer 21 comprising at least two polymer components 24, 25 having mutually different etching resistances; and applying at least once each of first plasma etching of the self-organizing block-copolymer layer 21 using plasma formed substantially from an ashing gas, and second plasma etching of the self-organizing block-copolymer layer 21 using plasma formed from a pure inert gas or mixture of a plurality of inert gases to selectively remove a first polymer phase 25.
申请公布号 JP2014075578(A) 申请公布日期 2014.04.24
申请号 JP20130176238 申请日期 2013.08.28
申请人 IMEC;TOKYO ELECTRON LTD 发明人 CHAN BOON TEIK;TAWARA SHIGERU
分类号 H01L21/3065;C08L53/00;H01L21/027 主分类号 H01L21/3065
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