| 摘要 |
Provided is an inspection chip that improves quantification precision. In the inspection chip (2), a virtual plane (H1) that is parallel to a quantitative surface (T) forms an angle (A) with a sample supply unit wall surface (119). A virtual plane (H2) that is parallel to the quantitative surface (T) forms an angle (B) with a first passage wall surface (120). A virtual plane (H3) that is parallel to the quantitative surface (T) forms an angle (C) with a second passage wall surface (122). A virtual plane (H4) that is parallel to the quantitative surface (T) forms an angle (D) with a holding section wall surface (118). The inspection chip (2) is configured so as to satisfy the following relationships: Angle (A) < Angle (B) < Angle (C); Angle (A) < Angle (D); Angle (D) < Angle (B). By satisfying these relationships, it is possible to accurately perform quantification without causing a shortage of a sample when quantifying said sample using a sample quantification unit (114). |
