发明名称 |
TRENCH GATE METAL OXIDE SEMICONDUCTOR FIELD EFFECT TRANSISTOR AND FABRICATING METHOD THEREOF |
摘要 |
A trench gate metal oxide semiconductor field effect transistor includes a substrate and a gate. The substrate has a trench. The trench is extended downwardly from a surface of the substrate. The gate includes an insertion portion and a symmetrical protrusion portion. The insertion portion is embedded in the trench. The symmetrical protrusion portion is symmetrically protruded over the surface of the substrate. |
申请公布号 |
US2014110777(A1) |
申请公布日期 |
2014.04.24 |
申请号 |
US201213654432 |
申请日期 |
2012.10.18 |
申请人 |
UNITED MICROELECTRONICS CORP. |
发明人 |
PENG CHUN-HONG;LAI YU-HSI |
分类号 |
H01L29/78;H01L21/283 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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