发明名称 TRENCH GATE METAL OXIDE SEMICONDUCTOR FIELD EFFECT TRANSISTOR AND FABRICATING METHOD THEREOF
摘要 A trench gate metal oxide semiconductor field effect transistor includes a substrate and a gate. The substrate has a trench. The trench is extended downwardly from a surface of the substrate. The gate includes an insertion portion and a symmetrical protrusion portion. The insertion portion is embedded in the trench. The symmetrical protrusion portion is symmetrically protruded over the surface of the substrate.
申请公布号 US2014110777(A1) 申请公布日期 2014.04.24
申请号 US201213654432 申请日期 2012.10.18
申请人 UNITED MICROELECTRONICS CORP. 发明人 PENG CHUN-HONG;LAI YU-HSI
分类号 H01L29/78;H01L21/283 主分类号 H01L29/78
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