发明名称 |
PSEUDO TESTER-PER-SITE FUNCTIONALITY ON NATIVELY TESTER-PER-PIN AUTOMATIC TEST EQUIPMENT FOR SEMICONDUCTOR TEST |
摘要 |
A system and method for testing devices are presented. Embodiments of the present invention use a central controller to coordinate the testing of a plurality of devices under test as well as a plurality of channel circuits that are each operable to be coupled to at least one I/O pin of a device under test of the aforementioned plurality of devices under test. Also, embodiments of the present invention include a plurality of intermediate processors that are each coupled to the central controller and operable to receive and send control signals. These intermediate processors are each coupled to a different set of channel circuits of the plurality of channel circuits and are operable to execute their own instantiation of a test program that is independent of any other intermediate processor of the plurality of intermediate processors for the testing of a device under test associated therewith. |
申请公布号 |
US2014114603(A1) |
申请公布日期 |
2014.04.24 |
申请号 |
US201213656684 |
申请日期 |
2012.10.20 |
申请人 |
MOON GERALD;LEVENTHAL IRA HARRIS;LARSON RON;KARAMCHANDANI SANGEET |
发明人 |
MOON GERALD;LEVENTHAL IRA HARRIS;LARSON RON;KARAMCHANDANI SANGEET |
分类号 |
G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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