发明名称 |
METHOD FOR PRODUCING AMORPHOUS OXIDE THIN FILM AND THIN FILM TRANSISTOR |
摘要 |
A method for producing an amorphous oxide thin film includes: a pre-treatment process of selectively changing a binding state of an organic component, at a temperature lower than a pyrolysis temperature of the organic component, in a first oxide precursor film containing the organic component and In, to obtain a second oxide precursor film in which, when an infrared wave number range of from 1380 cm -1 to 1520 cm -1 in an infrared absorption spectrum obtained by performing a measurement by Fourier transform infrared spectroscopy is divided into an infrared wave number range of from 1380 cm -1 to 1450 cm -1 and an infrared wave number range of from more than 1450 cm -1 to 1520 cm -1 , a peak positioned within the infrared wave number range of from 1380 cm -1 to 1450 cm -1 exhibits the maximum value in the infrared absorption spectrum within an infrared wave number range of from 1350 cm -1 to 1750 cm -1 ; and a post-treatment process of removing the organic component remaining in the second oxide precursor film, to transform the second oxide precursor film into an amorphous oxide thin film containing In. |
申请公布号 |
EP2722874(A1) |
申请公布日期 |
2014.04.23 |
申请号 |
EP20120800779 |
申请日期 |
2012.06.08 |
申请人 |
FUJIFILM CORPORATION |
发明人 |
UMEDA, KENICHI;TANAKA, ATSUSHI;SUZUKI, MASAYUKI;SHIMODA, TATSUYA |
分类号 |
H01L21/368;H01L21/336;H01L29/786;H01L51/50 |
主分类号 |
H01L21/368 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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